Dielectric composition and electronic component

ABSTRACT

A dielectric composition includes a main phase and a Ca—Zr—Si—O segregation phase. The main phase includes a main component expressed by ABO 3 . “A” includes at least one selected from calcium and strontium. “B” includes at least one selected from zirconium, titanium, hafnium, and manganese. The Ca—Zr—Si—O segregation phase includes at least calcium, zirconium, and silicon. The Ca—Zr—Si—O segregation phase includes 0.12-0.50 parts by mol of zirconium, provided that a total of calcium, strontium, silicon, and zirconium included in the Ca—Zr—Si—O segregation phase is 1 part by mol.

BACKGROUND OF THE INVENTION

The present invention relates to a dielectric composition and anelectronic component including dielectric layers composed of thedielectric composition.

An electronic circuit or a power supply circuit incorporated intoelectronic equipment is provided with a large number of electroniccomponents such as multilayer ceramic capacitors that utilize dielectriccharacteristics expressed by dielectric material. Patent Document 1discloses a dielectric composition including a main crystal phase whosemain components are CaTiO₃ and CaZrO₃ and a secondary phase whose maincomponents are Ca and Si.

However, it has been found that the above-mentioned dielectriccomposition does not sufficiently restraint the generation of cracks ina hot and humid environment.

Patent Document 1: JP2002265261 (A)

BRIEF SUMMARY OF INVENTION

The present invention has been achieved under such circumstances. It isan object of the invention to provide a dielectric composition capableof exhibiting a high restraint effect on the generation of cracks in ahot and humid environment and an electronic component including adielectric layer composed of the dielectric composition.

To achieve the above object, a dielectric composition according to thepresent invention includes a main phase and a Ca—Zr—Si—O segregationphase, wherein

the main phase includes a main component expressed by ABO₃,

“A” includes at least one selected from calcium and strontium,

“B” includes at least one selected from zirconium, titanium, hafnium,and manganese,

the Ca—Zr—Si—O segregation phase includes at least calcium, zirconium,and silicon, and

the Ca—Zr—Si—O segregation phase includes 0.12-0.50 parts by mol ofzirconium, provided that a total of calcium, strontium, silicon, andzirconium included in the Ca—Zr—Si—O segregation phase is 1 part by mol.

In the dielectric composition according to the present invention, it ispreferred that the Ca—Zr—Si—O segregation phase includes:

0.16-0.77 parts by mol of calcium;

0.00-0.30 parts by mol of strontium; and

0.08-0.45 parts by mol of silicon.

In the dielectric composition according to the present invention, it ispreferred that the Ca—Zr—Si—O segregation phase has a monoclinic crystalsystem.

In the dielectric composition according to the present invention, it ispreferred that the Ca—Zr—Si—O segregation phase has a circle equivalentdiameter of 0.05-2 μm.

In the dielectric composition according to the present invention, it ispreferred that an area ratio of the Ca—Zr—Si—O segregation phaseexpressed by a formula of (an area of the Ca—Zr—Si—O segregationphase/an area of the main phase)×100 [%] is 0.5-20%.

An electronic component according to the present invention includes thedielectric composition according to the present invention.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a cross-sectional view of a multilayer ceramic capacitoraccording to an embodiment of the present invention; and

FIG. 2 is a schematic view of a cross section of a dielectriccomposition constituting dielectric layers shown in FIG. 1.

DETAILED DESCRIPTION OF INVENTION <1. Multilayer Ceramic Capacitor>

FIG. 1 shows a multilayer ceramic capacitor 1 as an electronic componentaccording to the present embodiment. The multilayer ceramic capacitor 1includes an element body 10 formed by alternately laminating dielectriclayers 2 and internal electrode layers 3. A pair of external electrodes4 is formed on both ends of the element body 10 and is conducted withthe internal electrode layers 3 alternately arranged inside the elementbody 10. The element body 10 may have any shape, but normally has arectangular parallelepiped shape. The size of the element body 10 is notlimited and is appropriately determined based on usage.

1.1 Dielectric Layers

The dielectric layers 2 are composed of a dielectric compositionaccording to the present embodiment mentioned below. The thickness ofthe dielectric layers 2 per one layer (thickness between layers) is notlimited and can be determined freely based on desired characteristics,usage, etc. The thickness between layers of the dielectric layers 2 isnormally preferably 30 μm or less, more preferably 20 μm or less, andstill more preferably 10 μm or less.

In the present embodiment, the dielectric composition includesCa—Zr—Si—O segregation phases 16 mentioned below, and the generation ofcracks is thereby restrained in a hot and humid environment even if thedielectric layers 2 are thin. In the present embodiment, the dielectriclayers 2 can thereby be thinned to 2 μm.

The lamination number of dielectric layers 2 is not limited, but ispreferably, for example, 20 or more in the present embodiment.

1.2 Internal Electrode Layers

In the present embodiment, the internal electrode layers 3 are laminatedso that their ends are alternately exposed to the surfaces of two endsurface of the element body 10 facing each other.

The internal electrode layers 3 contain any conductive material. Thenoble metal of the conductive material is Pd, Pt, Ag—Pd alloy, etc. Thebase metal of the conductive material is Ni, Ni based alloy, Cu, Cubased alloy, etc. Incidentally, about 0.1 mass % or less of various finecomponents, such as P and/or S, may be contained in Ni, Ni based alloy,Cu, or Cu based alloy. The internal electrode layers 3 may be formedusing a commercially available electrode paste. The thickness of theinternal electrode layers 3 is determined appropriately based on usageor so.

1.3 External Electrodes

The external electrodes 4 contain any conductive material. For example,the external electrodes 4 contain a known conductive material of Ni, Cu,Sn, Ag, Pd, Pt, Au, their alloy, conductive resin, or the like. Thethickness of the external electrodes 4 is determined appropriately basedon usage or so.

<2. Dielectric Composition>

As shown in FIG. 2, the dielectric composition constituting thedielectric layers 2 according to the present embodiment includesCa—Zr—Si—O segregation phases 16 among main phases 14.

2.1 Main Phases

The main phases 14 according to the present embodiment include a maincomponent expressed by ABO₃. The main component is a component occupying80-100 parts by mass to 100 parts by mass of the main phases and ispreferably a component occupying 90-100 parts by mass to 100 parts bymass of the main phases.

The molar ratio of “A” to “B” expressed by (a molar ratio of “A”/a molarratio of “B”) may be one or may not be one. Preferably, the molar ratioof “A” to “B” is 0.9-1.2.

“A” includes at least one selected from calcium (Ca) and strontium (Sr).In the present embodiment, “A” is preferably calcium (Ca).

When a total of calcium (Ca) and strontium (Sr) included in “A” is 1part by mol, “A” may include 0-0.5 parts by mol of strontium (Sr).

“B” includes at least one selected from zirconium (Zr), titanium (Ti),hafnium (Hf), and manganese (Mn). In the present embodiment, “B” ispreferably zirconium (Zr).

When a total of zirconium (Zr), titanium (Ti), hafnium (Hf), andmanganese (Mn) is 1 part by mol, “B” preferably includes 0-0.2 parts bymol (more preferably, 0-0.1 parts by mol) of titanium (Ti).

When a total of zirconium (Zr), titanium (Ti), hafnium (Hf), andmanganese (Mn) is 1 part by mol, “B” preferably includes 0-0.05 parts bymol (more preferably, 0-0.02 parts by mol) of hafnium (Hf).

When a total of zirconium (Zr), titanium (Ti), hafnium (Hf), andmanganese (Mn) is 1 part by mol, “B” preferably includes 0-0.05 parts bymol (more preferably, 0-0.03 parts by mol) of manganese (Mn).

In the present embodiment, if necessary, the main phases 14 may includeelements of aluminum (Al), silicon (Si), vanadium (V), rare earthelements (RE), etc.

2.2 Ca—Zr—Si—O Segregation Phases

As shown in FIG. 2, the dielectric composition constituting thedielectric layers 2 according to the present embodiment includesCa—Zr—Si—O segregation phases 16 among the above-mentioned main phases14. The Ca—Zr—Si—O segregation phases 16 include at least calcium (Ca),zirconium (Zr), and silicon (Si). This allows the dielectric compositionaccording to the present embodiment to exhibit a high restraint effecton the generation of cracks in a hot and humid environment.

When a total of calcium (Ca), strontium (Sr), silicon (Si), andzirconium (Zr) included in the Ca—Zr—Si—O segregation phases 16 is 1part by mol, the Ca—Zr—Si—O segregation phases 16 preferably include0.16-0.77 parts by mol (more preferably, 0.22-0.53 parts by mol) ofcalcium (Ca).

When a total of calcium (Ca), strontium (Sr), silicon (Si), andzirconium (Zr) included in the Ca—Zr—Si—O segregation phases 16 is 1part by mol, the Ca—Zr—Si—O segregation phases 16 preferably include0.00-0.30 parts by mol (more preferably, 0-0.15 parts by mol) ofstrontium (Sr).

When a total of calcium (Ca), strontium (Sr), silicon (Si), andzirconium (Zr) included in the Ca—Zr—Si—O segregation phases 16 is 1part by mol, the Ca—Zr—Si—O segregation phases 16 preferably include0.12-0.50 parts by mol (more preferably, 0.17-0.45 parts by mol) ofzirconium (Zr).

When a total of calcium (Ca), strontium (Sr), silicon (Si), andzirconium (Zr) included in the Ca—Zr—Si—O segregation phases 16 is 1part by mol, the Ca—Zr—Si—O segregation phases 16 preferably include0.08-0.45 parts by mol (more preferably, 0.11-0.40 parts by mol) ofsilicon (Si).

Incidentally, the Ca—Zr—Si—O segregation phases 16 may include elementsother than the above-mentioned elements. For example, the Ca—Zr—Si—Osegregation phases 16 may include manganese (Mn), titanium (Ti), hafnium(Hf), magnesium (Mg), etc.

Preferably, the specific compound constituting the Ca—Zr—Si—Osegregation phases 16 is (Ca, Sr)₃ZrSi₂O₉. Incidentally, strontium (Sr)may not be included.

In the present embodiment, whether or not the dielectric compositionconstituting the dielectric layers 2 includes the Ca—Zr—Si—O segregationphases 16 is determined by any method and is determined by, for example,a specific method as below.

First of all, a cross section of the dielectric composition isphotographed using scanning transmission electron microscope (STEM) toobtain a bright field (BF) image. The area of the filed to bephotographed is not limited, but is about 1-10 μm square. In this brightfield, a region whose contrast is different from that of the main phases14 is determined to be a secondary phase. Whether or not there is adifferent contrast (i.e., whether or not there is a secondary phase) maybe determined visually, with image processing software, or the like.

As for the above-mentioned secondary phase, each amount of calcium (Ca),zirconium (Zr), and silicon (Si) is measured by EDS analysis.

When calcium (Ca), zirconium (Zr), and silicon (Si) exist at the samelocation in a secondary phase and the amount of zirconium (Zr) includedin the secondary phase is within the above-mentioned range, thissecondary phase is determined to be the Ca—Zr—Si—O segregation phase 16.

In addition, the existence of the Ca—Zr—Si—O segregation phases 16 maybe determined by mapping images. Specifically, a mapping image ofcalcium (Ca), a mapping image of zirconium (Zr), and a mapping image ofsilicon (Si) are compared to each other, and a region where calcium(Ca), zirconium (Zr), and silicon (Si) exist at the same location isdetermined. Then, when the amount of zirconium (Zr) included in thedetermined region is within the above-mentioned range, the secondaryphase is determined to be the Ca—Zr—Si—O segregation phase 16.

In the present embodiment, a circle equivalent diameter of each of theCa—Zr—Si—O segregation phases 16 is preferably 0.05-2 μm (morepreferably, 0.1-1 μm). Incidentally, the circle equivalent diameter is adiameter of a circle whose area is equal to that of each of theCa—Si—P—O segregation phases 16.

In the present embodiment, an area ratio of the Ca—Zr—Si—O segregationphases 16 is represented by a formula of “(Area of Ca—Zr—Si—Osegregation phases/Area of Main Phases)×100 [%]”.

In the present embodiment, the area ratio of the Ca—Zr—Si—O segregationphases 16 is preferably 0.5-20% (more preferably, 1-10%).

In the present embodiment, preferably, the Ca—Zr—Si—O segregation phases16 have a monoclinic crystal system.

In the present embodiment, the dielectric composition may include aCa—Zr—O based segregation phase. The Ca—Zr—O based segregation phase isCa stabilized zirconia. The Ca—Zr—O based segregation phase has a cubiccrystal system.

As mentioned above, the main phases 14 of the dielectric compositionaccording to the present embodiment includes a main component expressedby ABO₃, where “A” is at least one selected from calcium (Ca) andstrontium (Sr), “B” is at least one selected from zirconium (Zr),titanium (Ti), hafnium (Hf), and manganese (Mn). Hereinafter, thecomposition system of the main phases 14 according to the presentembodiment is represented by (Ca, Sr)ZrO₃.

Compared to when the composition system of the main phases 14 is BaTiO₃,when the composition system of the main phases 14 is (Ca, Sr)ZrO₃, thefollowing advantages can be obtained: the change in capacitance is smallat the time of voltage application; the change in capacitance is smallat the time of temperature change; and the dielectric loss is small evenif a high-frequency current flows. Thus, for example, the dielectriccomposition where the composition system of the main phases 14 is (Ca,Sr)ZrO₃ can favorably be utilized for resonant circuits.

The present inventor has found that when the dielectric compositionwhere the composition system of the main phases 14 is (Ca, Sr)ZrO₃includes the Ca—Zr—Si—O segregation phases 16, the deterioration ofcapacitor resistance is restrained in a hot and humid environment evenif the dielectric layers 2 are thin. The reason is not necessarilyclear, but it is conceivable that the progress of a mild crack generatedin the dielectric composition stops at the time of reaching theCa—Zr—Si—O segregation phases 16, which restrains the generation ofcracks that are large enough to reduce the capacitor resistance.

Therefore, the present embodiment can reduce the thickness of thedielectric layers 2 to the above-mentioned one.

<3. Method of Manufacturing Multilayer Ceramic Capacitor>

Next, a method of manufacturing the multilayer ceramic capacitor 1 shownin FIG. 1 is explained below.

In the present embodiment, prepared are a calcined powder of ABO₃particles (a main component of the main phases 14 constituting theabove-mentioned dielectric composition), a calcined powder of a firstadditive agent, and a calcined powder of a second additive agent.

The calcined powder of the first additive agent is a calcined powder ofcalcium (Ca), strontium (Sr), zirconium (Zr), and silicon (Si)constituting the Ca—Zr—Si—O segregation phases 16 after firing.

The calcined powder of the second additive agent is a calcined powder ofcalcium (Ca) and zirconium (Zr) to be included in a Ca—Zr—O segregationphase after firing.

Raw materials of the above-mentioned elements are not limited, andoxides of the above-mentioned elements can be used. It is also possibleto use various compounds that can obtain oxides of the above-mentionedelements by firing. The various compounds of the elements arecarbonates, oxalates, nitrates, hydroxides, organometallic compounds,etc. In the present embodiment, the starting raw materials of theelements are preferably powder.

Among the prepared starting raw materials, the raw material of the ABO₃particles is weighed to a predetermined ratio and is thereafter mixed inwet manner for a predetermined time using a ball mill or so. The mixedpowder is dried and thereafter heated at 700-1300° C. in the air toobtain a calcined powder of the ABO₃ particles. The calcined powder maybe pulverized for a predetermined time using a ball mill or so.

Various compounds or so, such as oxides of calcium (Ca), strontium (Sr),zirconium (Zr), and silicon (Si) constituting the Ca—Zr—Si—O segregationphases 16 after firing, are prepared and heated to obtain the calcinedpowder of the first additive agent.

The circle equivalent diameter of each of the Ca—Zr—Si—O segregationphases 16 can be changed by changing pulverization conditions of thecalcined powder of the first additive agent. For example, the circleequivalent diameter of each of the Ca—Si—P—O segregation phases 16 canbe adjusted by changing the pulverization time in a ball mill.

Various compounds or so, such as oxides of calcium (Ca) and zirconium(Zr) constituting the Ca—Zr—O based segregation phase after firing, areprepared and heated to obtain the calcined powder of the second additiveagent.

Then, a paste for manufacturing green chips is prepared. The calcinedpowder of the ABO₃ particles, the calcined powder of the first additiveagent, the calcined powder of the second additive agent, a binder, and asolvent are kneaded and turned into a paint to obtain a paste fordielectric layers. The binder and the solvent are known ones.

If necessary, the paste for dielectric layers may include additives,such as plasticizers and dispersants.

A paste for internal electrode layers is obtained by kneading theabove-mentioned raw material of the conductive material, a binder, and asolvent. The binder and the solvent are known ones. If necessary, thepaste for internal electrode layers may include additives, such assintering inhibitors and plasticizers.

A paste for external electrodes can be prepared similarly to the pastefor internal electrode layers.

Green sheets and internal electrode patterns are formed using theobtained pastes and are laminated to obtain green chips.

If necessary, the green chips are subjected to a binder removaltreatment. As conditions of the binder removal treatment, for example,the holding temperature is preferably 200-350° C.

After the binder removal treatment, the green chips are fired to obtainthe element body 10. In the present embodiment, the atmosphere of thefiring is not limited and may be the air or a reduction atmosphere. Inthe present embodiment, the holding temperature of the firing is notlimited and is, for example, 1200-1350° C.

After the firing, if necessary, the element body 10 is subjected to areoxidation treatment (annealing). As conditions of the annealing, theoxygen partial pressure of the annealing is preferably higher than thatof the firing, and the holding temperature is preferably 1150° C. orless.

A dielectric composition constituting the dielectric layers 2 of theelement body 10 obtained in the above-mentioned manner is theabove-mentioned dielectric composition. The end surfaces of the elementbody 10 are polished, applied with the paste for external electrodes,and fired to form the external electrodes 4. Then, if necessary, acoverage layer is formed on the surfaces of the external electrodes 4 byplating or so.

Accordingly, the multilayer ceramic capacitor 1 according to the presentembodiment is manufactured.

Modified Examples

In the above-mentioned embodiment, the electronic component according tothe present invention is a multilayer ceramic capacitor. However, theelectronic component according to the present invention is not limitedto multilayer ceramic capacitors and may be any other electroniccomponents including the above-mentioned dielectric composition.

For example, the electronic component according to the present inventionmay be a single-plate-type ceramic capacitor where the above-mentionedcomposition is provided with a pair of electrodes.

The dielectric composition may include no Ca—Zr—O based segregationphases.

Hereinbefore, an embodiment of the present invention is explained, butthe present invention is not limited to the above-mentioned embodimentand may be modified to various embodiments within the scope of thepresent invention.

Examples

Hereinafter, the present invention is explained in further detail withexamples and comparative examples, but is not limited to the followingexamples.

<Experiment 1>

In Sample No. 1-26, powders of calcium carbonate (CaCO₃), strontiumcarbonate (SrCO₃), zirconium oxide (ZrO₂), titanium oxide (TiO₂),hafnium oxide (HfO₂), and manganese carbonate (MnCO₃) were prepared asstarting raw materials of main phases included in a dielectriccomposition. The prepared starting raw materials were weighed so thatthe composition of the main phases after firing would be those shown inTable 1.

Next, the weighed powders were mixed in wet manner for 16 hours in aball mill using ion-exchanged water as dispersion medium, and thismixture was dried to obtain a mixed raw material powder. After that, themixed raw material powder was heated at 900° C. (holding temperature)for two hours (holding time) in the air to obtain a calcined powder of amain component compound of the main phases.

In addition, powders of calcium carbonate (CaCO₃), strontium carbonate(SrCO₃), zirconium oxide (ZrO₂), and silicon oxide (SiO₂) were preparedas raw materials of a first additive agent. The prepared starting rawmaterials were weighed so that the molar ratio of each elementconstituting the first additive agent would be one shown in Table 1, andthat the addition amount of the first additive agent would be 3 parts bymass.

Incidentally, the addition amount of the first additive agent was anaddition amount of the first additive agent when the main component ofthe main phases was 100 parts by mass.

The powders of calcium carbonate (CaCO₃), strontium carbonate (SrCO₃),zirconium oxide (ZrO₂), and silicon oxide (SiO₂) were heated at 900° C.(holding temperature) for two hours (holding time) in the air to obtaina calcined powder of the first additive agent.

The calcined powder of the main component compound of the main phasesand the calcined powder of the first additive agent were pulverized inwet manner for 16 hours in a ball mill using ion-exchanged water asdispersion medium and dried to obtain a dielectric raw material.

100 parts by mass of the dielectric raw material, 10 parts by mass ofpolyvinyl butyral resin, 5 parts by mass of dioctyl phthalate (DOP) asplasticizer, and 100 parts by mass of methyl ethyl ketone (MEK) assolvent were mixed in a ball mill and turned into a paste to obtain apaste for dielectric layers.

44.6 parts by mass of Ni particles, 52 parts by mass of terpineol, 3parts by mass of ethyl cellulose, and 0.4 parts by mass of benzotriazolewere kneaded by a triple roll and turned into a paste to obtain a pastefor internal electrode layers.

Then, a green sheet was formed on a PET film using theabove-manufactured paste for dielectric layers. Next, an internalelectrode layer was printed in a predetermined pattern on the greensheet using the paste for internal electrode layers. After that, thesheet was peeled from the PET film to manufacture the green sheet withthe internal electrode layer.

Next, a plurality of green sheets with the internal electrode layer waslaminated and bonded with pressure to obtain a green laminated body. Thegreen laminated body was cut into a predetermined size to obtain a greenchip.

The green chip was subjected to a binder removal treatment, fired, andannealed with the following conditions to obtain an element body.

As the conditions of the binder removal treatment, the heating rate was25° C./hour, the holding temperature was 260° C., the temperatureholding time was eight hours, and the atmosphere was the air.

As the firing conditions, the heating rate was 200° C./hour, the holdingtemperature was 1200° C., and the holding time was two hours. Thecooling rate was 200° C./hour. Incidentally, the atmosphere gas was ahumidified N₂+H₂ mixed gas, and the oxygen partial pressure was 10⁻¹²MPa.

As the annealing conditions, the heating rate was 200° C./hour, theholding temperature was 1000° C., the temperature holding time was twohours, the cooling rate was 200° C./hour, and the atmosphere gas was ahumidified N₂ gas (oxygen partial pressure: 10⁻⁷ MPa).

Incidentally, a wetter was used for humidification of the atmospheregases of the firing and the annealing.

Next, the surface of the capacitor element body was subjected to barrelpolishing, applied with Cu as external electrodes, and fired in nitrogengas to obtain a capacitor sample of a multilayer ceramic capacitor shownin FIG. 1. The size of the capacitor sample was 3.2 mm×1.6 mm×1.6 mm.The thickness of each of the dielectric layers was 2.5 μm. The thicknessof each of the internal electrode layers was 1.1 μm. The number ofdielectric layers sandwiched by the internal electrode layers was 200.

A secondary phase was determined by STEM in a visual field of 10 μm×10μm on a cross section of the dielectric composition (dielectric layers)of the capacitor sample. Each amount of calcium (Ca), strontium (Sr),zirconium (Zr), and silicon (Si) was measured with EDS to determinewhether or not the secondary phase was a Ca—Zr—Si—O segregation phase.

In the capacitor samples of Table 1, the molar ratio of the firstadditive agent of calcium (Ca), strontium (Sr), zirconium (Zr), andsilicon (Si) and the average molar ratio of the Ca—Zr—Si—O segregationphases corresponded with each other.

The Ca—Zr—Si—O segregation phases included in the dielectric composition(dielectric layers) were subjected to electron beam diffraction, and anelectron beam pattern was analyzed to determine the crystal system. Theresults are shown in Table 1.

A first PCBT test was carried out as below. The capacitor samples weremounted on a FR-4 substrate (glass epoxy substrate) by Sn—Ag—Cu solder,put into a pressure cooker tank, and subjected to an acceleratedmoisture resistance load test where voltage (50V) was applied for 100hours in an atmosphere of 121° C. and humidity 95%. This test wascarried out for 500 capacitor samples. The number of failures for eachof the capacitor samples is shown in Table 1.

TABLE 1 Main Component of Main Phase (ABO₃*1) A-site B-site FirstAdditive Agent *2 Molar Molar Ratio of Each Molar Ratio of Each Elementto Ca—Zr—Si—O Ratio of Element to Total (1 mol) Total (1 mol) of Ca, Sr,Si, and Zr Segregation Phase First Sample Sr/ of (Zr + Ti + Hf + Mn)Included in First Additive Agent Crystal PCBT No. (Ca + Sr) Ti Hf Mn CaSr Zr Si Existence Structure Test 1 0 0.01 0.01 0.02 no 11 2 0.3 0.040.01 0.02 no 12 3 0 0.01 0.01 0.02 0.50 0.00 0.39 0.11 yes monoclinic 04 0 0.01 0.01 0.02 0.15 0.00 0.85 0.00 no trigonal 18 5 0 0.01 0.01 0.020.42 0.00 0.03 0.54 no no measurement 19 6 0 0.01 0.01 0.02 0.27 0.000.07 0.66 no no measurement 22 7 0 0.01 0.01 0.02 0.50 0.00 0.17 0.33yes monoclinic 0 8 0.3 0.04 0.01 0.02 0.50 0.00 0.39 0.11 yes monoclinic0 9 0.3 0.04 0.01 0.02 0.50 0.00 0.17 0.33 yes monoclinic 0 10 0.3 0.040.01 0.02 0.35 0.15 0.17 0.33 yes monoclinic 0 11 0.3 0.04 0.01 0.020.35 0.15 0.39 0.11 yes monoclinic 0 12 0 0 0.01 0.02 0.50 0.00 0.390.11 yes monoclinic 0 13 0 0.01 0 0.02 0.50 0.00 0.39 0.11 yesmonoclinic 0 14 0 0.01 0.01 0 0.50 0.00 0.39 0.11 yes monoclinic 0 150.5 0.01 0.01 0.02 0.50 0.00 0.39 0.11 yes monoclinic 0 16 0 0.2 0.010.02 0.50 0.00 0.39 0.11 yes monoclinic 0 17 0 0.01 0.05 0.02 0.50 0.000.39 0.11 yes monoclinic 0 18 0 0.01 0.01 0.05 0.50 0.00 0.39 0.11 yesmonoclinic 0 19 0 0.01 0.01 0.02 0.30 0.20 0.39 0.11 yes monoclinic 0 200 0.01 0.01 0.02 0.20 0.30 0.39 0.11 yes monoclinic 0 21 0 0.01 0.010.02 0.44 0.00 0.45 0.11 yes monoclinic 0 22 0 0.01 0.01 0.02 0.39 0.000.50 0.11 yes monoclinic 0 23 0 0.01 0.01 0.02 0.77 0.00 0.12 0.11 yesmonoclinic 0 24 0 0.01 0.01 0.02 0.21 0.00 0.39 0.40 yes monoclinic 0 250 0.01 0.01 0.02 0.16 0.00 0.39 0.45 yes monoclinic 0 26 0 0.01 0.010.02 0.53 0.00 0.39 0.08 yes monoclinic 0 *1(Molar Ratio of A/MolarRatio of B) = 1 *2Additive Amount of First Additive Agent: 3 parts bymass (Main Component of Main Phase: 100 parts by mass)

According to Table 1, compared to when there were no Ca—Zr—Si—Osegregation phases (Sample No. 1, 2, and 4-6), when there was theCa—Zr—Si—O segregation phase (Sample No. 3 and 7-26), the number offailures at the first PCBT test was small, and the generation of cracksin a hot and humid environment was highly restrained.

<Experiment 2>

Capacitor samples were obtained similarly to Experiment 1, except thatthe circle equivalent diameter of Sample No. 31-35 was adjusted bychanging the pulverization time of the calcined powder of the firstadditive agent in a ball mill.

In Sample No. 31-35, the existence of Ca—Zr—Si—O segregation phases wasdetermined similarly to Experiment 1. The results are shown in Table 2.

In Sample No. 3 and 31-35, an average circle equivalent diameter ofCa—Zr—Si—O segregation phases at 10 points was obtained.

In Sample No. 31-35, a first PCBT test was carried out similarly toExperiment 1. The results are shown in Table 2.

A second PCBT test was carried out as below. The capacitor samples weremounted on a FR-4 substrate (glass epoxy substrate) by Sn—Ag—Cu solder,put into a pressure cooker tank, and subjected to an acceleratedmoisture resistance load test where voltage (50V) was applied for 500hours in an atmosphere of 121° C. and humidity 95%. This test wascarried out for 100 capacitor samples. The number of failures for eachof the capacitor samples is shown in Table 2.

TABLE 2 Main Component of Main Phase (ABO₃*1) First Additive Agent *2Ca—Zr—Si—O B-site Molar Ratio of Each Element Segregation Phase MolarRatio of Each to Total (1 mol) of Ca, Sr, Circle A-site Element to Total(1 mol) Si, and Zr Included in First Equivalent First Second Sample Sr/of (Zr + Ti + Hf + Mn) Additive Agent Diameter PCBT PCBT No. (Ca + Sr)Ti Hf Mn Ca Sr Zr Si Existence [μm] Test Test 31 0 0.01 0.01 0.02 0.500.00 0.39 0.11 yes 0.05 0 2 32 0 0.01 0.01 0.02 0.50 0.00 0.39 0.11 yes0.1 0 0 33 0 0.01 0.01 0.02 0.50 0.00 0.39 0.11 yes 0.2 0 0 3 0 0.010.01 0.02 0.50 0.00 0.39 0.11 yes 0.5 0 0 34 0 0.01 0.01 0.02 0.50 0.000.39 0.11 yes 1 0 0 35 0 0.01 0.01 0.02 0.50 0.00 0.39 0.11 yes 2 0 3*1(Molar Ratio of A/Molar Ratio of B) = 1 *2Additive Amount of FirstAdditive Agent: 3 parts by mass (Main Component of Main Phase: 100 partsby mass)

According to Table 2, compared to when the circle equivalent diameter ofthe Ca—Zr—Si—O segregation phase was 0.05 μm (Sample No. 31) and to whenthe circle equivalent diameter of the Ca—Zr—Si—O segregation phase was 2μm (Sample No. 35), when the circle equivalent diameter of theCa—Zr—Si—O segregation phase was 0.1 μm or more and 1 μm or less (SampleNo. 32, 33, 3, and 34), the number of failures at the second PCBT testwas small, and the generation of cracks in a hot and humid environmentwas more highly restrained.

<Experiment 3>

Capacitor samples of Sample No. 41-44 were obtained similarly toExperiment 1 except for changing the addition amount of the firstadditive agent.

In Sample No. 41-44, the existence of Ca—Zr—Si—O segregation phases wasdetermined similarly to Experiment 1.

In Sample No. 3 and 41-44, an average area ratio of the Ca—Zr—Si—Osegregation phases in 10 square visual fields (10 μm×10 μm) wasobtained.

In Sample No. 41-44, a first PCBT test was carried out similarly toExperiment 1. The results are shown in Table 3.

In Sample No. 41-44, a second PCBT test was carried out similarly toExperiment 3. The results are shown in Table 3.

TABLE 3 Main Component of First Additive Agent Main Phase (ABO₃*1)Additive B-site Amount A-site Molar Ratio of Each Molar Ratio of EachElement to *3 Ca—Zr—Si—O Sr/ Element to Total (1 mol Total (1 mol) ofCa, Sr, Si, and Zr [parts Segregation Phase First Second Sample (Ca + of(Zr + Ti + Hf + Mn) Included in First Additive Agent by Area PCBT PCBTNo. Sr) Ti Hf Mn Ca Sr Zr Si mass] Existence Ratio Test Test 41 0 0.010.01 0.02 0.50 0.00 0.39 0.11 0.3 yes 0.50% 0 5 42 0 0.01 0.01 0.02 0.500.00 0.39 0.11 0.6 yes   1% 0 0 3 0 0.01 0.01 0.02 0.50 0.00 0.39 0.113.0 yes   5% 0 0 43 0 0.01 0.01 0.02 0.50 0.00 0.39 0.11 6.0 yes   10% 00 44 0 0.01 0.01 0.02 0.50 0.00 0.39 0.11 12.0 yes   20% 0 4 *1(MolarRatio of Al Molar Ratio of B) = 1 *3 Additive Amount of First AdditiveAgent (Main Component of Main Phase: 100 parts by mass)

According to Table 3, compared to when the area ratio of the Ca—Zr—Si—Osegregation phases was 0.50% (Sample No. 41) and to when the area ratioof the Ca—Zr—Si—O segregation phases was 20% (Sample No. 44), when thearea ratio of the Ca—Zr—Si—O segregation phases was larger than 0.50%and smaller than 20% (Sample No. 42, 3, and 43), the number of failuresat the second PCBT test was small, and the generation of cracks in a hotand humid environment was more highly restrained.

Description of the Reference Numerical

-   1 . . . multilayer ceramic capacitor-   10 . . . element body-   2 . . . dielectric layer-   14 . . . main phase-   16 . . . Ca—Zr—Si—O segregation phase-   3 . . . internal electrode layer-   4 . . . external electrode

What is claimed is:
 1. A dielectric composition comprising a main phaseand a Ca—Zr—Si—O segregation phase, wherein the main phase includes amain component expressed by ABO₃, “A” includes at least one selectedfrom calcium and strontium, “B” includes at least one selected fromzirconium, titanium, hafnium, and manganese, the Ca—Zr—Si—O segregationphase includes at least calcium, zirconium, and silicon, and theCa—Zr—Si—O segregation phase includes 0.12-0.50 parts by mol ofzirconium, provided that a total of calcium, strontium, silicon, andzirconium included in the Ca—Zr—Si—O segregation phase is 1 part by mol.2. The dielectric composition according to claim 1, wherein theCa—Zr—Si—O segregation phase includes: 0.16-0.77 parts by mol ofcalcium; 0.00-0.30 parts by mol of strontium; and 0.08-0.45 parts by molof silicon.
 3. The dielectric composition according to claim 1, whereinthe Ca—Zr—Si—O segregation phase has a monoclinic crystal system.
 4. Thedielectric composition according to claim 2, wherein the Ca—Zr—Si—Osegregation phase has a monoclinic crystal system.
 5. The dielectriccomposition according to claim 1, wherein the Ca—Zr—Si—O segregationphase has a circle equivalent diameter of 0.05-2 μm.
 6. The dielectriccomposition according to claim 2, wherein the Ca—Zr—Si—O segregationphase has a circle equivalent diameter of 0.05-2 μm.
 7. The dielectriccomposition according to claim 3, wherein the Ca—Zr—Si—O segregationphase has a circle equivalent diameter of 0.05-2 μm.
 8. The dielectriccomposition according to claim 4, wherein the Ca—Zr—Si—O segregationphase has a circle equivalent diameter of 0.05-2 μm.
 9. The dielectriccomposition according to claim 1, wherein an area ratio of theCa—Zr—Si—O segregation phase expressed by a formula of (an area of theCa—Zr—Si—O segregation phase/an area of the main phase)×100 [%] is0.5-20%.
 10. The dielectric composition according to claim 2, wherein anarea ratio of the Ca—Zr—Si—O segregation phase expressed by a formula of(an area of the Ca—Zr—Si—O segregation phase/an area of the mainphase)×100 [%] is 0.5-20%.
 11. The dielectric composition according toclaim 3, wherein an area ratio of the Ca—Zr—Si—O segregation phaseexpressed by a formula of (an area of the Ca—Zr—Si—O segregationphase/an area of the main phase)×100 [%] is 0.5-20%.
 12. The dielectriccomposition according to claim 4, wherein an area ratio of theCa—Zr—Si—O segregation phase expressed by a formula of (an area of theCa—Zr—Si—O segregation phase/an area of the main phase)×100 [%] is0.5-20%.
 13. The dielectric composition according to claim 5, wherein anarea ratio of the Ca—Zr—Si—O segregation phase expressed by a formula of(an area of the Ca—Zr—Si—O segregation phase/an area of the mainphase)×100 [%] is 0.5-20%.
 14. An electronic component comprising thedielectric composition according to claim
 1. 15. An electronic componentcomprising the dielectric composition according to claim
 2. 16. Anelectronic component comprising the dielectric composition according toclaim
 3. 17. An electronic component comprising the dielectriccomposition according to claim
 5. 18. An electronic component comprisingthe dielectric composition according to claim 9.